| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 0,96 | 3,84 | Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry
|
| 0,00 | 0,00 | Optical characterization of non-uniform thin films using imaging spectrophotometry
|
| 4,45 | 26,71 | Influence of technological conditions on mechanical stresses inside diamond-like carbon films
|
| 1,34 | 6,72 | Optical measurement of mechanical stresses in diamond-like carbon films
|
| 0,52 | 3,12 | Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody
|
| 0,00 | 0,00 | Digital two-wavelength holographic interference microscopy for surface roughness measurement
|
| 4,95 | 29,68 | Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
|
| 1,83 | 7,34 | Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
|
| 6,65 | 33,23 | Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
|
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(c) Michal Bulant, 2011