| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 10,14 | 30,42 | Reflectance of non-uniform thin films
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| 0,96 | 3,84 | Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry
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| 0,00 | 0,00 | Characterization of optical thin films exhibiting defects
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| 9,13 | 18,25 | Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
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| 0,00 | 0,00 | Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
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| 2,84 | 5,68 | Application of the wavelet transformation in AFM data analysis
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| 13,53 | 27,06 | Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films
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| 64,10 | 192,31 | Influence of cross-correlation effects on the optical quantities of rough films
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| 8,90 | 44,52 | Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
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| 0,00 | 0,00 | Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly
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| 0,52 | 3,12 | Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody
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| 10,18 | 30,55 | Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
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| 17,39 | 34,78 | Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
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| 9,13 | 18,25 | Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
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| 4,45 | 26,71 | Influence of technological conditions on mechanical stresses inside diamond-like carbon films
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| 1,34 | 6,72 | Optical measurement of mechanical stresses in diamond-like carbon films
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| 17,39 | 34,78 | Optical properties of NiO thin films prepared by pulsed laser deposition technique
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| 17,39 | 34,78 | Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
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| 0,00 | 0,00 | Optical characterization of non-uniform thin films using imaging spectrophotometry
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| 0,67 | 2,01 | Scanning thermal microscopy - theory and applications
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| 14,25 | 14,25 | Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
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| 11,59 | 11,59 | Spectroscopic ellipsometry on lamellar gratings
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| 11,59 | 34,78 | Spectroscopic ellipsometry of sinusoidal surface-relief gratings
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| 1,89 | 5,68 | Combination of optical methods and atomic force microscopy at characterization of thin film systems
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| 34,78 | 34,78 | Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films
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| 8,43 | 16,85 | Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
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| 0,00 | 0,00 | Ellipsometry in characterization of thin films
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| 0,00 | 0,00 | Digital two-wavelength holographic interference microscopy for surface roughness measurement
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| 1,55 | 4,64 | Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
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| 9,71 | 38,84 | Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
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| 10,98 | 21,95 | Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
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| 2,75 | 8,24 | Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
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| 0,00 | 0,00 | Optical quantities of rough films calculated by Rayleigh-Rice theory
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| 1,87 | 9,36 | Optical characterization of non-stoichiometric silicon nitride films
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| 2,81 | 8,42 | Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
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| 10,88 | 43,54 | Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
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| 0,00 | 0,00 | Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
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| 3,15 | 15,76 | Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
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| 4,95 | 29,68 | Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
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| 1,83 | 7,34 | Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
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| 6,65 | 33,23 | Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
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| 0,00 | 0,00 | Study of thickness reduction of a-C:H thin film under UV light irradiation
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| 1,32 | 5,28 | UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
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(c) Michal Bulant, 2011