| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 3,36 | 6,72 | Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets
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| 3,36 | 6,72 | Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets
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| 6,75 | 20,26 | Phase composition-dependent physical and mechanical properties of YbZrO solid solutions
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| 3,51 | 14,04 | Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel
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| 2,67 | 8,00 | Effect of composition changes on properties and defect structure of crystalline Sm-doped ZrO2
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| 2,81 | 14,04 | Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry
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(c) Michal Bulant, 2011