| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 3,51 | 14,04 | Vacancies and self-interstitials dynamics in silicon wafers
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| 0,00 | 0,00 | Kinetics of oxygen, vacancies and self-interstitials in silicon wafers
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| 3,31 | 16,55 | Homogenization of CZ Si wafers by Tabula Rasa annealing
|
| 10,38 | 51,92 | X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers
|
| 0,00 | 0,00 | Nucleation and Precipitation of Interstitial Oxygen in Czochralski Silicon
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| 0,00 | 0,00 | Oxygen precipitation during two-stage annealing of Cz-Si
|
| 0,00 | 0,00 | Study of oxygen precipitates in silicon using Bragg and Laue x-ray diffraction
|
| 10,67 | 42,69 | Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation
|
| 12,77 | 51,08 | Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealing
|
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(c) Michal Bulant, 2011