| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 33,57 | 67,15 | X-ray diffuse scattering from stacking faults in Czochralski silicon
|
| 10,38 | 51,92 | X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers
|
| 0,00 | 0,00 | Nucleation and Precipitation of Interstitial Oxygen in Czochralski Silicon
|
Back
(c) Michal Bulant, 2011