| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 33,57 | 67,15 | X-ray diffuse scattering from stacking faults in Czochralski silicon
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| 44,20 | 44,20 | Anomalous X-ray diffraction from self-assembled PbSe/PbEuTe quantum dots
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| 33,57 | 33,57 | X-ray diffraction from polycrystalline multilayers in grazing-incidence geometry: Measurement of crystallite size depth distribution
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| 10,38 | 51,92 | X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers
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| 2,85 | 2,85 | X-ray scattering methods for the study of epitaxial self-assembled quantum dots
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| 0,00 | 0,00 | Investigation of the spontaneous lateral composition modulation in InAs/AlAs short-period superlattices by grazing-incidence x-ray diffraction
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| 13,43 | 53,72 | Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction
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| 19,00 | 19,00 | Patterson-like analysis of diffuse x-ray scattering from epitaxial mosaic PbTe layers on Si(111)
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| 19,00 | 38,00 | Ge/Si islands in a three-dimensional island crystal studied by x-ray diffraction
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| 29,47 | 29,47 | Diffuse X-ray scattering from misfit and threading dislocations in relaxed epitaxial layers
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| 0,00 | 0,00 | Evolution of the spontaneous lateral composition modulation in InAs/AlAs superlattices on InP
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| 7,58 | 7,58 | Diffuse X-ray scattering from GaN/SiC (0001) thin films
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| 28,50 | 28,50 | Investigation of shape, strain, and interdiffusion in InGaAs quantum rings using grazing incidence x-ray diffraction
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| 0,00 | 0,00 | IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES
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| 0,00 | 0,00 | IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES
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| 0,00 | 0,00 | In-situ investigations of Si and Ge interdiffusion in Si cascade structures
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| 8,39 | 8,39 | Mn incorporation in as-grown and annealed (Ga,Mn)As layers studied by x-ray diffraction and standing-wave fluorescence
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| 32,59 | 65,19 | Nonlinear Evolution of Surface Morphology in InAs/AlAs Superlattices via Surface Diffusion
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| 20,00 | 40,01 | Microdiffraction imaging of dislocation densities in microstructured samples
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| 12,36 | 24,71 | Standing-wave effects in grazing-incidence x-ray diffraction from polycrystalline multilayers
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| 22,38 | 44,76 | In situ investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering
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| 2,34 | 4,68 | Interdiffusion in SiGe alloys studied by x-rays
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| 26,69 | 53,39 | Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis
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| 54,20 | 54,20 | Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods
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| 48,89 | 48,89 | Surface Exchange and Shape Transitions of PbSe Quantum Dots during Overgrowth
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(c) Michal Bulant, 2011