| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 0,82 | 0,82 | Nonlinear evolution of surface morphology in short-period superlattices
|
| 9,93 | 19,86 | X-ray diffraction on precipitates in Czochralski-grown silicon
|
| 3,51 | 14,04 | Vacancies and self-interstitials dynamics in silicon wafers
|
| 0,00 | 0,00 | Kinetics of oxygen, vacancies and self-interstitials in silicon wafers
|
| 0,00 | 0,00 | Interdiffusion in Ge rich SiGe alloys studied by in-situ diffraction
|
| 12,54 | 25,09 | Interdiffusion in Ge rich SiGe/Ge multilayers studied by in situ diffraction
|
| 3,31 | 16,55 | Homogenization of CZ Si wafers by Tabula Rasa annealing
|
| 0,00 | 0,00 | Investigation of the spontaneous lateral composition modulation in InAs/AlAs short-period superlattices by grazing-incidence x-ray diffraction
|
| 97,78 | 97,78 | Morphological instability in InAs/GaSb superlattices due to interfacial bonds
|
| 13,43 | 53,72 | Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction
|
| 0,00 | 0,00 | Evolution of the spontaneous lateral composition modulation in InAs/AlAs superlattices on InP
|
| 32,59 | 65,19 | Nonlinear Evolution of Surface Morphology in InAs/AlAs Superlattices via Surface Diffusion
|
| 0,00 | 0,00 | Oxygen precipitation during two-stage annealing of Cz-Si
|
| 0,00 | 0,00 | Study of oxygen precipitates in silicon using x-ray diffraction techniques
|
| 0,00 | 0,00 | Study of oxygen precipitates in silicon using Bragg and Laue x-ray diffraction
|
| 0,00 | 0,00 | Utilization of synchrotron radiation for in-situ diffusion studies
|
| 10,67 | 42,69 | Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation
|
| 12,77 | 51,08 | Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealing
|
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(c) Michal Bulant, 2011